## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

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Page 21

This

This

**unit**utilizes two X - ray tubes and two pairs of movable detectors to locate the peak , one pair of detectors at y = 0o and one pair at ys = 45 ° . Both peak positions are found by matching the intensity in each detector with its ...Page 72

... atoms per

... atoms per

**unit**cell , v m ( Y ) the**unit**cell volume in cubic angstroms , and N , the atomic fraction of component i , all at a depth Y. Also , A ; and ( ulp ) ; are the corresponding atomic weight and mass absorption coefficients .Page 74

Qm = 7.94 x 10-26 13 1 + cos2 2a cosa 20 m Fm ? exp ( - 2Mm ) ( 12 ) sin 20 m ( 1 + cos2 2a ) in cgs

Qm = 7.94 x 10-26 13 1 + cos2 2a cosa 20 m Fm ? exp ( - 2Mm ) ( 12 ) sin 20 m ( 1 + cos2 2a ) in cgs

**units**. The following terms vary with the composition of the diffracting element : the volume of the**unit**cell vm , the structure ...### What people are saying - Write a review

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### Contents

The Investigation of Composition | 63 |

Penetration Distance | 75 |

Choice of Binary System for Composition | 86 |

Copyright | |

11 other sections not shown

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### Common terms and phrases

absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening coefficients components composition concentration containing cooling cross section curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution donor effect electron elements emission energy et al example excitation experimental factor field function give given heat hyperfine important impurities increasing intensity interaction iron laser lattice layer less magnetic material measurements Metals method Monemar Mössbauer neighbor observed obtained occur optical parameter peak phase Phys position possible powders problem produce properties range rays recently recombination region relative residual stress ribbon sample semiconductors shift shown solid spacing specimen spectra spectrum sputtering steel stress structure studies substrate surface target techniques temperature term thickness values variation volume X-ray